大规模集成电路抗辐射性能无损筛选方法
周东, 郭旗, 任迪远, 李豫东, 席善斌, 孙静, 文林. 大规模集成电路抗辐射性能无损筛选方法[J]. 强激光与粒子束, 2013, 25(2): 485.
Zhou Dong, Guo Qi, Ren Diyuan, Li Yudong, Xi Shanbin, Sun Jing, Wen Lin. Nondestructive screening method for radiation hardened performance of large scale integration[J]. High Power Laser and Particle Beams, 2013, 25(2): 485.
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周东, 郭旗, 任迪远, 李豫东, 席善斌, 孙静, 文林. 大规模集成电路抗辐射性能无损筛选方法[J]. 强激光与粒子束, 2013, 25(2): 485. Zhou Dong, Guo Qi, Ren Diyuan, Li Yudong, Xi Shanbin, Sun Jing, Wen Lin. Nondestructive screening method for radiation hardened performance of large scale integration[J]. High Power Laser and Particle Beams, 2013, 25(2): 485.
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