红外与毫米波学报, 2016, 35 (2): 214, 网络出版: 2016-05-11  

利用同步辐射光电子能谱技术研究Pb1-xSrxTe薄膜的能带移动及其组成异质结能带带阶

Band shift of Pb1-xSrxTe thin film and its band alignment using synchrotron radiation photoelectron spectroscope
作者单位
1 浙江大学城市学院 信息与电气工程学院, 浙江 杭州 310015
2 浙江大学 物理系, 浙江 杭州 310027
3 中国科技大学 国家同步辐射实验室, 安徽 合肥 230029
引用该论文

蔡春锋, 彭曼丽, 翟继志, 毕岗, 张兵坡, 王淼, 吴惠桢, 张文华, 朱俊发. 利用同步辐射光电子能谱技术研究Pb1-xSrxTe薄膜的能带移动及其组成异质结能带带阶[J]. 红外与毫米波学报, 2016, 35(2): 214.

CAI Chun-Feng, PENG Man-Li, ZHAI Ji-Zhi, BI Gang, ZHANG Bing-Po, WANG Miao, WU Hui-Zhen, ZHANG Wen-Hua, ZHU Jun-Fa. Band shift of Pb1-xSrxTe thin film and its band alignment using synchrotron radiation photoelectron spectroscope[J]. Journal of Infrared and Millimeter Waves, 2016, 35(2): 214.

参考文献

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蔡春锋, 彭曼丽, 翟继志, 毕岗, 张兵坡, 王淼, 吴惠桢, 张文华, 朱俊发. 利用同步辐射光电子能谱技术研究Pb1-xSrxTe薄膜的能带移动及其组成异质结能带带阶[J]. 红外与毫米波学报, 2016, 35(2): 214. CAI Chun-Feng, PENG Man-Li, ZHAI Ji-Zhi, BI Gang, ZHANG Bing-Po, WANG Miao, WU Hui-Zhen, ZHANG Wen-Hua, ZHU Jun-Fa. Band shift of Pb1-xSrxTe thin film and its band alignment using synchrotron radiation photoelectron spectroscope[J]. Journal of Infrared and Millimeter Waves, 2016, 35(2): 214.

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