强激光与粒子束, 2014, 26 (11): 114007, 网络出版: 2014-12-08  

基于蒙卡和粒子示踪程序的电子成像模拟分析

Simulation analysis of electron imaging method based on Monte Carlo simulation and particle tracer software
王致远 1,2,*杜应超 1,2黄文会 1,2
作者单位
1 清华大学 工程物理系, 北京 100084
2 清华大学 粒子技术与辐射成像教育部重点实验室, 北京 100084
引用该论文

王致远, 杜应超, 黄文会. 基于蒙卡和粒子示踪程序的电子成像模拟分析[J]. 强激光与粒子束, 2014, 26(11): 114007.

Wang Zhiyuan, Du Yingchao, Huang Wenhui. Simulation analysis of electron imaging method based on Monte Carlo simulation and particle tracer software[J]. High Power Laser and Particle Beams, 2014, 26(11): 114007.

参考文献

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[14] 杜应超, 黄文会,颜立新,等. 清华大学汤姆逊散射超短脉冲X射线源研究[J]. 强激光与粒子束, 2009, 21(2): 265-270.(Du Yingchao, Huang Wenhui, Yan Lixin, et al. Researches of Thomson scattering ultra-short pulse X-ray source at Tsinghua University. High Power Laser and Particle Beams, 2009, 21(2): 265-270)

王致远, 杜应超, 黄文会. 基于蒙卡和粒子示踪程序的电子成像模拟分析[J]. 强激光与粒子束, 2014, 26(11): 114007. Wang Zhiyuan, Du Yingchao, Huang Wenhui. Simulation analysis of electron imaging method based on Monte Carlo simulation and particle tracer software[J]. High Power Laser and Particle Beams, 2014, 26(11): 114007.

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