中国激光, 2019, 46 (5): 0508001, 网络出版: 2019-11-11
超快光电子显微技术在纳米光子学中的应用 
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Applications of Ultrafast Photoemission Electron Microscopy in Nanophotonics
图 & 表
图 1. 不同PEEM装置的示意图。(a)最初的光电子显微镜[7];(b) Engel设计的PEEM系统[8];(c)测量表面光电子实空间分布的PEEM原理图;(d)测量表面光电子倒空间分布的PEEM原理图;(e)光电子能量分析的PEEM原理图[9]
Fig. 1. Schematics of different PEEM systems. (a) Initial photoemission microscope[7]; (b) PEEM system designed by Engel[8]; (c) principle diagram of PEEM for measurement of surface photoemission in real space; (d) principle diagram of PEEM for measurement of surface photoemission in reciprocal space; (e) principle diagram of PEEM for energy analysis of photoemission electrons[
图 3. 用PEEM对金纳米粒子进行近场成像[6]。(a)掺铌二氧化钛衬底上金纳米粒子的SEM图像;(b)金纳米粒子的消光光谱;(c)中心波长800 nm的飞秒激光激发下金纳米粒子的PEEM图像;(d)积分光电子强度和激发激光功率之间的关系
Fig. 3. Near-field mapping of gold nanoparticles (Au NPs) by PEEM[6]. (a) SEM image of Au NPs on Nb-doped TiO2 substrate; (b) extinction spectrum of Au NPs; (c) PEEM image of Au NPs upon irradiation by femtosecond laser pulse with central wavelength of around 800 nm; (d) relationship between excitation laser power and integral photoemission intensity
图 4. 近场成像。(a)飞秒激光共振激发的金纳米方块[16]PEEM图像;(b)同时用飞秒激光和UV光照射下的金纳米方块[16]PEEM图像;(c)飞秒激光共振激发的二聚体[6]PEEM图像;(d)同时用飞秒激光和UV光照射下的二聚体[6]PEEM图像
Fig. 4. Near-field imaging. (a) PEEM image of Au nanoblock resonantly excited by fs-laser[16]; (b) PEEM image of Au nanoblock simultaneously irradiated by fs-laser and UV light[16]; (c) PEEM image of dimer resonantly excited by fs-laser[6]; (d) PEEM image of dimer simultaneously irradiated by fs-laser and UV light[6
图 5. 斜入射下金纳米方块的近场光谱性质[16]。(a)不同偏振下各自归一化的光电子强度随激发光波长的关系;(b)不同偏振下光电子强度随激发光波长的关系(相对于p偏振下峰值强度进行归一化);(c)四极子模式峰值波长处对应的PEEM图,插图为数值模拟得到的电荷分布;(d)偶极子模式峰值波长处对应的PEEM图,插图为数值模拟得到的电荷分布
Fig. 5. Near-field spectral property of Au nanoblocks upon oblique incidence[16]. (a) Photoemission (PE) intensity as a function of excitation wavelength for both p- and s- polarized light with normalization done for each curve; (b) PE intensity as a function of excitation wavelength for both p- and s- polarized light with both curves normalized for peak in curve for p-pol; (c) PEEM images obtained at peak wavelength for quadrupole and inset indicating n
图 6. Dolmen结构的近场光谱[19]。(a)光电子强度随激发光波长的依赖关系;(b) UV光照射下的PEEM图像;(c)~(e)图(a)中标示的三个特征波长处的飞秒激光激发的PEEM图
Fig. 6. Near-field spectrum of dolmen structure[19]. (a) Photoemission (PE) intensity as a function of excitationwavelength; (b) UV-PEEM image; (c)-(e) three PEEM images obtained at three characterized wavelengths indicated in (a)
图 8. 斜入射下金纳米方块的时间分辨的PEEM测量。(a)用于时间分辨PEEM测量的两种金纳米方块的反射光谱;(b)对应的不同相位延迟下光电子强度的演化[6];(c)偶极子模式的光电子强度随抽运探测时间延迟的变化关系; (d)四极子模式的光电子强度随抽运探测时间延迟的变化关系[16]
Fig. 8. Time-resolved PEEM measurements of Au nanoblocks upon oblique incidence. (a) Reflection spectra of two Au nanoblocks for time-resolved PEEM measurement; (b) corresponding evolution of photoemission signal with phase delay[6]; (c) photoemission intensity for dipole mode as a function of delay time between pump and probe pulses; (d) photoemission intensity for quadrupole mode as a function of delay time between pump and probe pulses[
图 9. 强耦合的表面等离激元纳米结构的时间分辨PEEM测量[22]。(a)扫描透射电镜测量的样品截面图,插图显示了扫描电镜测量的样品俯视图;(b)退相干时间与两个耦合模式的失谐量之间的关系
Fig. 9. Time-resolved PEEM measurements of strong coupling plasmonic nanostructures[22]. (a) Sectional view of sample imaged by scanning transmission electron microscope and inset indicating top view of sample imaged by scanning electron microscope; (b) evolution of dephasing time against detuning between two modes
孙泉, 祖帅, 上野贡生, 龚旗煌, 三泽弘明. 超快光电子显微技术在纳米光子学中的应用[J]. 中国激光, 2019, 46(5): 0508001. Quan Sun, Shuai Zu, Kosei Ueno, Qihuang Gong, Hiroaki Misawa. Applications of Ultrafast Photoemission Electron Microscopy in Nanophotonics[J]. Chinese Journal of Lasers, 2019, 46(5): 0508001.
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