光电技术应用, 2012, 27 (2): 38, 网络出版: 2012-05-08  

电化学腐蚀MCP中载流子传输特性作用与影响分析

Carrier Transportation Characteristic and Effect in Electrochemical Corrosion of MCP
作者单位
长春理工大学, 吉林 长春 130012
引用该论文

任天宇, 薛阳, 端木庆铎, 石晓光, 王培翎, 张影, 李璐璐. 电化学腐蚀MCP中载流子传输特性作用与影响分析[J]. 光电技术应用, 2012, 27(2): 38.

REN Tian-yu, XUE Yang, DUANMU Qing-duo, SHI Xiao-guang, WANG Pei-ling, ZHANG Ying, LI Lu-lu. Carrier Transportation Characteristic and Effect in Electrochemical Corrosion of MCP[J]. Electro-Optic Technology Application, 2012, 27(2): 38.

参考文献

[1] D R Turner, J Electrochem. Soc.105,2008.402.

[2] Xiaopeng Li, Hong Seok Seo. A periodic array of silicon pillars fabricated by photoelectrochemical etching. Electrochimica Acta 54,2009. 6978-6982.

[3] Wern-Dare Jehng, Jing-Chie Lin, Chien-Ming Lai,et al. Energy band diagrams for the photo-electrochemical dissolution of n-Si (100) in HF. Materials Chemistry and Physics 91, 2005. 513-517.

[4] Chun-yen chang,po-lung yu Ed the. Semiconductor physics and production technology of the original. High made press. 2000. 544-562(Chinese).

[5] 任天宇,王洋,薛阳.长脉冲激光与金属相互作用影响分析[J].光电技术应用,2011,26(6):28-32.

[6] 端木庆铎,李野,卢耀华,等.高长径比微孔列阵及其应 用[C]//第四届全国微米/纳米技术协会议专刊(上海). 2000.

[7] M P Stewart, J M Buriak, Adv. Mater., 2000, 12, 859-869.

[8] M J Schoning, A Kurowski, M. Thust, P Kordos, J W Schul-tze, H. Luth, Sens. Actuators, B, 2000, 64, 59-64.

[9] A Steel, M Torres, J Hartwell, Y -Y Yu, N Ting, G Hoke, H Yang, in Microarray Biochip Technology (Ed. M. Schena), Bio Techniques Books, Nattick, MA, 2000, Chapter 5.

[10] Liu Xue. Semiconductor physics and production technology of the original[M]. High made press. 2008:544-562.

[11] HeTianWire bonding technology situation and development trend of [J]. Electronic industrial specialized equipment. 2004,33(10):3-6.

[12] S KThe Gandhi, ZhangXiKang translation, etc. Very large scale integrated circuit technology principle[M]. publishing house of electronics industry,1986:411 ~ 414(Chinese).

[13] Xiaoge Gregory Zhang. Silicon oxide and the electrochemi-cal[M]. Beijing: chemical press. 2004:161 ~ 165(Chinese).

[14] V A Burrows, Y J Chabal, G S Higashi,et al. Infrared spectroscopy of Si( 111) surfaces after HF teratment. Hydrogen termination and suface morphology. Appl.phys. 1988, Lett.53( 11 ),998-999.

任天宇, 薛阳, 端木庆铎, 石晓光, 王培翎, 张影, 李璐璐. 电化学腐蚀MCP中载流子传输特性作用与影响分析[J]. 光电技术应用, 2012, 27(2): 38. REN Tian-yu, XUE Yang, DUANMU Qing-duo, SHI Xiao-guang, WANG Pei-ling, ZHANG Ying, LI Lu-lu. Carrier Transportation Characteristic and Effect in Electrochemical Corrosion of MCP[J]. Electro-Optic Technology Application, 2012, 27(2): 38.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!