红外与毫米波学报, 2003, 22 (1): 27, 网络出版: 2006-05-10  

Hg1-xCdxTe材料中的Te离子空位共振能级

Te ION VACANCY RESONANCE LEVEL IN Hg1-xCdxTe MATERIALS
作者单位
1 昆明物理研究所,云南,昆明,650223
2 南开大学物理科学学院光子学中心,天津,300071
摘要
利用拉曼显微镜在室温下对金属有机化合物气相外延(MOVPE)和液相外延(LPE)方法生长的Hg1-xCdxTe薄膜材料以及用加速坩埚旋转布里奇曼(ACRT-Bridgman)和Te溶剂方法生长的Hg1-xCdxTe体材料进行了系统研究. 在上述4种方法生长的材料的显微拉曼光谱中,均发现在导带底上方且远高于材料导带底对应能级的显微荧光发光峰. 通过详细比较可以判定,高于导带底约1.5eV的显微荧光起源于Hg1-xCdxTe材料中的Te离子空位与材料导带底的共振能级发光,从而确定在碲镉汞材料中存在一个稳定的Te离子空位共振能级。
Abstract
The MOVPE Hg 1-xCd xTe epitaxial film, LPE Hg 1-xCd xTe epitaxial film and Hg 1-xCd xTe bulk wafers grown by ACRT-Bridgman and Te solvent methods were measured by means of Raman microscopy in the room temperature. In all the experimental specimen, the micro-Photoluminescence emission centered above the bottom of Hg 1-xCd xTe conduction band about 1.5eV were observed for the first time. It is confirmed that the micro-photoluminescence was induced by the Te ion vacancy resonance level.
参考文献

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黄晖, 许京军, 张存洲, 张光寅. Hg1-xCdxTe材料中的Te离子空位共振能级[J]. 红外与毫米波学报, 2003, 22(1): 27. 黄晖, 许京军, 张存洲, 张光寅. Te ION VACANCY RESONANCE LEVEL IN Hg1-xCdxTe MATERIALS[J]. Journal of Infrared and Millimeter Waves, 2003, 22(1): 27.

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