铋含量的变化对Bi<sub>x</sub>FeO<sub>3</sub>薄膜微结构和光学性质的影响

通过溶胶凝胶技术在Si衬底上制备了x从0.80增大到1.20的BixFeO3薄膜样品.分析了Bi元素含量的改变对BFO薄膜微结构和光学性质的影响，表明在Bi缺失和Bi过量的BixFeO3薄膜样品中均出现了Bi2Fe4O9杂相和铁氧化物杂相，导致BixFeO3薄膜晶格的菱形扭曲结构发生变化.测试得到了薄膜的拉曼散射谱和椭圆偏振光谱，拉曼散射谱反映了BixFeO3薄膜样品中的振动模式明显受到x取值的影响.根据椭偏数据拟合得到的结果表明折射率在波长600nm以下范围内随着x的减小而减小.而样品的禁带宽度从2.65eV 到 2.76eV，在x为1.05和1.10时得到最大值.

Abstract

The BixFeO3 films (0.80≤x≤ 1.20) were prepared by sol-gel technique on Si substrates. Effects of x variation on microstructures and optical properties of the BixFeO3 films are reported. It is shown that in the films with both insufficient and excess bismuth dosage, impurity phases such as Bi2Fe4O9 and iron oxide appeared. Raman spectra of the films were presented in the spectral range of 50~800cm-1. The refractive index (n) of the films decreases with increasing x at wavelength lower than 600nm, the extinction coefficients (k) of all films were comparable. The bandgaps of the films changed from 2.65eV to 2.76eV.

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李晓晞, 邓红梅, 张金中, 杨平雄, 褚君浩. 铋含量的变化对Bi_xFeO₃薄膜微结构和光学性质的影响[J]. 红外与毫米波学报, 2014, 33(1): 19. LI Xiao-Xi, DENG Hong-Mei, ZHANG Jin-Zhong, YANG Ping-Xiong, CHU Jun-Hao. Bismuth composition dependence of properties of Bi thin films[J]. Journal of Infrared and Millimeter Waves, 2014, 33(1): 19.

铋含量的变化对Bi_xFeO₃薄膜微结构和光学性质的影响

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