用超短光脉冲测量半导体微波器件的S参数
袁树忠, 潘家齐, 吕福云, 范万德, 李献元. 用超短光脉冲测量半导体微波器件的S参数[J]. 中国激光, 1998, 25(6): 495.
袁树忠, 潘家齐, 吕福云, 范万德, 李献元. S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses[J]. Chinese Journal of Lasers, 1998, 25(6): 495.
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袁树忠, 潘家齐, 吕福云, 范万德, 李献元. 用超短光脉冲测量半导体微波器件的S参数[J]. 中国激光, 1998, 25(6): 495. 袁树忠, 潘家齐, 吕福云, 范万德, 李献元. S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses[J]. Chinese Journal of Lasers, 1998, 25(6): 495.
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