[1] Konczakowska A, Cichosz J, Stawarz B. RTS noise in optoelectronic coupled devices［C］// Inter. Conf. on Noise & Fluctuations, 2005: 669-672.

[2] 包军林, 庄奕琪, 杜 磊, 等. 光电耦合器件1/f噪声和G-R噪声的机理研究［J］. 光子学报, 2005, 34(6): 857-860.

    Bao Junlin, Zhuang Yiqi, Du Lei, et al. Investigation of mechanisms on 1/f noise and G-R noise in optoelectronic coupled devices［J］. Acta Photonica Sinica, 2005, 34(6): 857-860.

[3] 包军林, 庄奕琪, 杜 磊, 等. 光电耦合器件闪烁噪声模型［J］. 光子学报, 2005, 34(9): 1359-1362.

    Bao Junlin, Zhuang Yiqi, Du Lei, et al. A model for 1/f noise in optoelectronic coupled devices［J］. Acta Photonica Sinica, 2005, 34(9): 1359-1362.

[4] Zhuang Y, Bao J. 1/f noise and G-R noise related to reliability in optoelectronic coupled devices［C］// Inter. Conf. on Noise & Fluctuations, 2013: 1-4.

[5] 余永涛, 王之哲, 郭长荣, 等. 光电耦合器件低频噪声特性与可靠性老化研究［J］. 半导体光电, 2018, 39(2): 192-196.

    Yu Yongtao, Wang Zhizhe, Guo Changrong, et al. Research on low-frequency noise characteristic reliability aging of optoelectronics coupled devices［J］. Semiconductor Optoelectronics, 2018, 39(2): 192-196.

[6] Dai Y, Xu J. The noise analysis and noise reliability indicators of optoelectronic coupled devices［J］. Solid State Electron., 2000, 44(8): 1495-1500.

[7] Jones B K. Electrical noise as a reliability indicator in electronic devices and components［J］. IEEE Proc. Circuits, Devices and Systems, 2002, 149(1): 13-16.

[8] 周 江. 基于电噪声的光电耦合器加严筛选技术及应用［D］. 西安: 西安电子科技大学, 2006.

    Zhou Jiang. The method of screening optocouplers based on the low-frequency electric noise［D］. Xian: Xidian University, 2006.

[9] 杜 磊, 庄奕琪. 噪声用于电子元器件和电路可靠性评估［C］// 中国电子学会电子元件学术年会, 2010: 132-142.

    Du Lei, Zhuang Yiqi. Electrical noise as a reliability estimate tool for electronic devices and components［C］// Chinese Institute of Electronics Components Annual Conf., 2010: 132-142.

[10] Konczakowska A. Methodology of semiconductor devices classification into groups of differentiated quality［J］. Microelectronics Reliability, 2008, 48(1): 37-44.

[11] 周求湛, 张彦创, 周承鹏, 等. 1/f噪声的精确测量及其在太阳能电池可靠性筛选中的应用［J］. 光学精密工程, 2012, 20(3): 625-631.

    Zhou Qiuzhan, Zhang Yanchuang, Zhou Chengpeng, et al. Precise measurement of 1/f noise and its application to reliability screening of solar cells［J］. Optics and Precision Engineering, 2012, 20(3): 625-631.

[12] Hasse L Z, Babicz S, Kaczmarek L, et al. Quality assessment of ZnO-based varistors by 1/f noise［J］. Microelectronics Reliability, 2014, 54(1): 192-199.

[13] 陈晓娟, 王文婷, 景 非. 基于低频噪声检测光电耦合器件可靠性的频域筛选方法［J］. 电子器件, 2015, 38(1): 58-62.

    Chen Xiaojuan, Wang Wenting, Jing Fei. A novel method for reliability estimation of optoelectronic coupled devices based on low-frequency noise measurements［J］. Chinese J. of Electron Devices, 2015, 38(1): 58-62.

[14] 周求湛, 刘 祥, 高 健. 基于Gower相似系数的太阳能电池可靠性筛选方法［J］. 光电子·激光, 2014(2): 207-212.

    Zhou Qiuzhan, Liu Xiang, Gao Jian. Reliability screening method for solar cells based on Gower similarity coefficient［J］. J. of Optoelectronics·Laser, 2014(2): 207-212.