电荷耦合器件的γ辐照剂量率效应研究

对电荷耦合器件进行了不同剂量率的γ辐照实验, 通过多种参数的测试探讨了剂量率与电荷耦合器件性能退化的关系, 并对损伤的物理机理进行分析。辐照和退火结果表明: 暗信号和暗信号非均匀性是γ辐照的敏感参数, 电荷转移效率和饱和输出电压随剂量累积有缓慢下降的趋势; 暗场像素灰度值整体抬升, 像元之间的差异显著增加; 电荷耦合器件的暗信号增量与剂量率呈负相关性, 器件存在潜在的低剂量率损伤增强效应。分析认为, 剂量率效应是由界面态和氧化物陷阱电荷竞争导致的。通过电子-空穴对复合模型、质子输运模型和界面态形成对机理进行了解释。

Abstract

The experiments of dose rate on charge coupled devices(CCDs) were carried out to investigate the relationship between the dose rate and the electrical parameters of the device, and the degradation mechanism was analyzed. With the accumulation of the dose, the dark signal (DS)and dark non-uniformly signal(DNS) increase significantly, and the both charge transfer efficiency (CTE)and saturation output voltage(SOV) tend to decrease slowly. The whole dark pixel value uplifts and the non-uniform between pixels becomes obviously. The dark signal of the CCD is negatively correlated with the dose rate, and the device presents the potential of the-low-dose-rate-damage enhancement effect. It is considered that the dose rate effect is caused by the competition between the interface states and oxide traps, and the mechanism is explained by the electron-hole pair recombination model and the damage model in the annealing process.

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武大猷, 文林, 汪朝敏, 何承发, 郭旗, 李豫东, 曾俊哲, 汪波, 刘元. 电荷耦合器件的γ辐照剂量率效应研究[J]. 发光学报, 2016, 37(6): 711. WU Da-you, WEN Lin, WANG Chao-min, HE Cheng-fa, GUO Qi, LI Yu-dong, ZENG Jun-zhe, WANG Bo, LIU Yuan. Dose Rate Effects of γ Irradiation on CCDs[J]. Chinese Journal of Luminescence, 2016, 37(6): 711.

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