Chinese Optics Letters, 2018, 16 (1): 011404, Published Online: Jul. 17, 2018   

Stress damage process of silicon wafer under millisecond laser irradiation Download: 764次

Author Affiliations
1 School of Science, Nanjing University of Science & Technology, Nanjing 210094, China
2 Institute of Mechanical and Electrical Engineering, Zhoukou Normal University, Zhoukou 466000, China
Figures & Tables

Fig. 1. Experimental setup for testing damage.

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Fig. 2. Real-time images induced by different laser energy densities for (a) 19 and (b) 23J/cm2, respectively. (c) and (d) Corresponding morphological images taken by an optical microscope (OM) after experiment.

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Fig. 3. (a)–(d) Real-time images at different times. The laser energy density is 28J/cm2. (e) the morphological image taken by the OM after the experiment.

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Fig. 4. Simulation model of a silicon wafer under laser irradiation.

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Fig. 5. (Color online) (a) Temperature of spot center and (b) von Mises stresses along the X axis at 0.7, 1, 1.1, and 1.3 ms, respectively.

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Fig. 6. Images just before fracture. The experiment is the same as that of Fig. 3.

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Fig. 7. (Color online) (a) Concentric circle and (b) shear stresses along it at 1.5 ms. S1, S2, and S3 represent the shear stress along (111)[110], (111)[101], and (111)[011], respectively.

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Fig. 8. (a) Typical ablation morphology induced by a millisecond laser and (b) a nanosecond laser.

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Zhichao Jia, Tingzhong Zhang, Huazhong Zhu, Zewen Li, Zhonghua Shen, Jian Lu, Xiaowu Ni. Stress damage process of silicon wafer under millisecond laser irradiation[J]. Chinese Optics Letters, 2018, 16(1): 011404.

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