激光与光电子学进展, 2004, 41 (7): 46, 网络出版: 2006-06-12  

微波相敏技术在光学材料特性研究中的应用

Microwave Phase-sensitive Technique Applied in the Study of Characteristics of Optical Materials
作者单位
1 嘉应学院物理系, 梅州514015
2 河北大学物理科学与技术学院,保定 671002
摘要
利用微波相敏技术,获得了用硫作不同时间表面处理AgBrI晶体自由光电子和束缚光电子时间衰减信号,分析了光电子衰减时间、电子陷阱效应、光电子寿命、有效陷阱深度及束缚电子转移时间与表面处理时间的关系,获得了最佳的表面处理时间为45分钟,有效陷阱深度为0.255~0.265 eV。
Abstract
By means of microwave phase-sensitive technique, the instantaneous decay signals of free electrons and trapped electrons in AgBrI have been obtained with surface disposition in sulfur for different times. The relationships between disposing time and the decay time of photoelectrons, the effects of electron traps, the lifetime of photoelec-trons, the effective depth of traps and the transfer time of trapped electrons have been analyzed.
参考文献

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陆晓东, 李晓苇. 微波相敏技术在光学材料特性研究中的应用[J]. 激光与光电子学进展, 2004, 41(7): 46. 陆晓东, 李晓苇. Microwave Phase-sensitive Technique Applied in the Study of Characteristics of Optical Materials[J]. Laser & Optoelectronics Progress, 2004, 41(7): 46.

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