超精表面缺陷检测的光学混频误差分析 下载: 616次
[1] 柳忠尧. 用于掩模板表面形貌测量的外差干涉显微系统的研究[D]. 北京: 清华大学, 2004. 1-12.
Liu Zhongyao. The Study on Heterodyne Interferometric Microscope for Profiles of Microelectronic Mask Surfaces Measurement [D]. Beijing: Tsinghua University, 2004.1-12.
[2] 宋康, 赵玉龙, 蒋庄德. 激光干涉微轮廓测量仪[J]. 光学 精密工程, 2003, 11(3): 245-249.
[3] 张以谟, 井文才, 张红霞, 等. 数字化白光扫描干涉仪的研究[J]. 光学 精密工程, 2004, 12(6): 560-565.
[4] Haoshan Lin, Yuhe Li, Dongsheng Wang, et al.. Nanoscale defect detection by Heterodyne interferometry [J]. Appl Opt, 2009, 48(8): 1502-1506.
[5] Dejiao Lin, Hong Jiang, Chunyong Yin. Analysis of nonlinearity in a high-resolution grating interferometer [J]. Optics & Laser Technology, 2000, 32(2): 95-99.
[6] Chunyong Yin, Gaoliang Dai, Zhixia Chao, et al.. Determining the residual nonlinearity of a high-precision heterodyne interferometer [J]. Opt Eng, 1999, 38(8): 1361-1365.
[7] Wenmei Hou, Gunter Wilkening. Investigation and compensation of the nonlinearity of heterodyne interferometers [J]. Preci Eng, 1992, 14(2): 91-98.
[8] 戴高良, 殷纯永, 谢广平. 纳米精度外差干涉仪非线性漂移的研究[J]. 光学学报, 1998, 18(12): 1697-1702.
[9] 戴高良, 晁志霞, 殷纯永, 等. 纳米精度双频激光干涉仪非线性误差的确定方法[J]. 中国激光, 1999, 26(11): 987-992.
[10] 赵慧洁. 外差干涉仪频率混叠误差分析[J]. 计量学报, 1999, 20(3): 166-171.
Zhao Huijie. Error analysis of frequency mixing for heterodyne interferometer [J]. Acta Metrologica Sinica, 1999, 20(3): 166-171.
[11] 赵慧洁, 张广军. 影响激光外差高精度计量的几个关键因素[J]. 北京航空航天大学学报, 2002, 28(2): 221-224.
Zhao Huijie, Zhang Guangjun. Factors affecting the precision of heterodyne interferometer [J]. Journal of Beijing University of Aeronautics and Astronautics, 2002, 28(2): 221-224.
[12] Wenmei Hou. Optical parts and the nonlinearity in heterodyne interferometers [J]. Preci Eng, 2006, 30(3): 337-346.
[13] 宁志高, 程兆谷, 高海军. 外差干涉仪混频误差分析[J]. 中国激光, 2005, 32(6): 852-855.
[14] S J A G Cosijns, H Haitjema, P H J Schellekens. Modeling and verifying non-linearities in heterodyne displacement interferometry [J]. Preci Eng, 2002, 26(4): 448-455.
[15] 邱宗明, 刘君, 郭彦珍. 塞曼激光外差干涉仪的非线性分析及校正[J]. 光子学报, 1998, 27(11): 991-995.
Qiu Zongming, Liu Jun, Guo Yanzhen. Nonlinear analysis and improvement of Zeeman laser heterodyne interferometer [J]. Acta Photonica Sinica, 1998, 27(11): 991-995.
[16] V G Badami, S R Patterson. A frequency domain method for the measurement of nonlinearity in heterodyne interferometry [J]. Preci Eng, 2000, 24(1): 41-49.
[17] 陈洪芳, 丁雪梅, 钟志, 等. 激光外差干涉检偏器旋转误差对非线性误差的影响[J]. 中国激光, 2005, 32(9): 1281-1285.
[18] 陈洪芳, 丁雪梅, 钟志. 偏振分光镜分光性能非理想对激光外差干涉非线性误差的影响[J]. 中国激光, 2006, 33(11): 1562-1566.
[19] R M A 阿查姆, N M 巴夏拉. 椭圆偏振测量术和偏振光[M]. 梁民基, 尹树百, 张福初等, 译. 北京:科学出版社,1986. 18-60.
R M A Azzam, N M Bashara. Ellipsometry and Polarized Light [M]. Liang Mingji, Yin Shubai, Zhang Fuchu, et al. Transl. Beijing: Science Press, 1986. 18-60.
[20] PRETIOS. PT-1105C 双频激光头[OL]. http://www.pretios.com/document/pt1105bc.pdf. [2014-12-16].
林浩山, 陈举科, 李玉和, 李庆祥, 潘福东, 王力虎. 超精表面缺陷检测的光学混频误差分析[J]. 激光与光电子学进展, 2015, 52(2): 021203. Lin Haoshan, Chen Juke, Li Yuhe, Li Qingxiang, Pan Fudong, Wang Lihu. Error Analysis of Optical Frequency Mixing on Detecting Device for Superfinish Surface Scratch[J]. Laser & Optoelectronics Progress, 2015, 52(2): 021203.