电荷耦合器件饱和效应对PIE成像质量的影响
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王宝升, 高淑梅, 王继成, 朱健强, 刘诚. 电荷耦合器件饱和效应对PIE成像质量的影响[J]. 光学学报, 2013, 33(6): 0611001. Wang Baosheng, Gao Shumei, Wang Jicheng, Zhu Jianqiang, Liu Cheng. Influence of Charge Coupled Device Saturation on PIE Imaging[J]. Acta Optica Sinica, 2013, 33(6): 0611001.