红外与毫米波学报, 2017, 36 (6): 756, 网络出版: 2018-01-04
基于反射差分显微术的有机薄膜空间均一性研究
Spatial uniformity of organic thin films based on reflectance difference microscopy
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霍树春, 胡春光, 沈万福, 李艳宁, 胡小唐. 基于反射差分显微术的有机薄膜空间均一性研究[J]. 红外与毫米波学报, 2017, 36(6): 756. HUO Shu-Chun, HU Chun-Guang, SHEN Wan-Fu, LI Yan-Ning, HU Xiao-Tang. Spatial uniformity of organic thin films based on reflectance difference microscopy[J]. Journal of Infrared and Millimeter Waves, 2017, 36(6): 756.