激光与光电子学进展, 2013, 50 (1): 011203, 网络出版: 2012-11-13
利用白光干涉垂直扫描法测量波片延迟量
Retardation Measurement of Wave Plates Using White-Light Interference Vertical Scanning Method
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王军, 陈磊, 吴泉英, 臧涛成. 利用白光干涉垂直扫描法测量波片延迟量[J]. 激光与光电子学进展, 2013, 50(1): 011203. Wang Jun, Chen Lei, Wu Quanying, Zang Taocheng. Retardation Measurement of Wave Plates Using White-Light Interference Vertical Scanning Method[J]. Laser & Optoelectronics Progress, 2013, 50(1): 011203.
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