光学 精密工程, 2017, 25 (10): 2676, 网络出版: 2017-11-24
CMOS图像传感器光子转移曲线辐照后的退化机理
Degradation mechanism for photon transfer curve of CMOS image sensor after irradiation
Metrics
摘要访问:4782次
PDF 下载:5次
全文浏览:6次
总被查询:0次
冯婕, 李豫东, 文林, 周东, 马林东. CMOS图像传感器光子转移曲线辐照后的退化机理[J]. 光学 精密工程, 2017, 25(10): 2676. FENG Jie, LI Yu-dong, WEN Lin, ZHOU Dong, MA Lin-dong. Degradation mechanism for photon transfer curve of CMOS image sensor after irradiation[J]. Optics and Precision Engineering, 2017, 25(10): 2676.