激光与光电子学进展, 2012, 49 (9): 091404, 网络出版: 2012-07-13   

980 nm半导体激光器长期老化结果及失效分析 下载: 667次

Long-Term Aging and Failure Analysis for 980 nm Laser Diodes
作者单位
1 证据科学教育部重点实验室(中国政法大学), 北京 100088
2 中国科学院半导体研究所, 北京 100083
3 北京工业大学电子信息与控制工程学院, 北京 100024
引用该论文

刘斌, 刘媛媛, 崔碧峰. 980 nm半导体激光器长期老化结果及失效分析[J]. 激光与光电子学进展, 2012, 49(9): 091404.

Liu Bin, Liu Yuanyuan, Cui Bifeng. Long-Term Aging and Failure Analysis for 980 nm Laser Diodes[J]. Laser & Optoelectronics Progress, 2012, 49(9): 091404.

参考文献

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[9] 方高瞻, 肖建伟, 马骁宇 等. 带有腔面非注入区的大功率808 nm GaAs/AlGaAs激光二级管列阵 [J]. 高技术通讯, 2000, 10(12): 9~11

    Fang Gaozhan, Xiao Jianwei, Ma Xiaoyu et al.. High power GaAs/AlGaAs(λ=808 nm) laser diode arrays with non-injection regions near the facets [J]. High Technology Letters, 2000, 10(12): 9~11

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[12] 刘斌, 张敬明, 马骁宇 等. 980 nm脊型波导激光器腔面非注入区的研究 [J]. 激光与红外, 2003, 33(2): 109~111

    Liu Bin, Zhang Jingming, Ma Xiaoyu et al.. The investigation of 980 nm ridge waveguide lasers with current non-injection regions by proton implantation [J]. Laser & Infrared, 2003, 33(2): 109~111

[13] Liu Bin, Zhang Jingming, Ma Xiaoyu et al.. Investigation of 980 nm ridge waveguide lasers with current non-injection regions by He ion implantation [J]. J. Semiconductors, 2003, 24(3): 234~237

刘斌, 刘媛媛, 崔碧峰. 980 nm半导体激光器长期老化结果及失效分析[J]. 激光与光电子学进展, 2012, 49(9): 091404. Liu Bin, Liu Yuanyuan, Cui Bifeng. Long-Term Aging and Failure Analysis for 980 nm Laser Diodes[J]. Laser & Optoelectronics Progress, 2012, 49(9): 091404.

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