980 nm半导体激光器长期老化结果及失效分析 
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刘斌, 刘媛媛, 崔碧峰. 980 nm半导体激光器长期老化结果及失效分析[J]. 激光与光电子学进展, 2012, 49(9): 091404. Liu Bin, Liu Yuanyuan, Cui Bifeng. Long-Term Aging and Failure Analysis for 980 nm Laser Diodes[J]. Laser & Optoelectronics Progress, 2012, 49(9): 091404.
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