光学学报, 2001, 21 (6): 673, 网络出版: 2006-08-10
Cu/Ti超晶格薄膜的强紫外反射性能研究
Strong UV Reflecting Characteristics of Cu/Ti Superlattic Films
摘要
采用直流磁控溅射方法制备了一维二组元Cu/Ti周期超晶格金属薄膜,研究了基片温度、膜周期数、基片取向与紫外反射的关系。当基片加热温度为470℃时,在硅(100)晶面上生长的30层Cu/Ti膜,层间膜厚控制在1:3、膜总厚度控制为300nm时,所制备的超晶格薄膜在5°入射角下对200nm的紫外光,其反射率可高达90%。
Abstract
One-dimensional and two-component Cu/Ti superlattice films have been deposited by DC magnetron sputtering. The influences of substrate temperature, periodic number and substrate structure on UV-reflectivity of Cu/Ti superlattic films are studied. The films fabricated at 470 ℃ substrate temperature, on Si(100) substrate and with 30 pair layers have a high UV-reflectivity of about 90% at 200 nm and 5° from normal incidence.
罗佳慧, 李燕, 杨成韬. Cu/Ti超晶格薄膜的强紫外反射性能研究[J]. 光学学报, 2001, 21(6): 673. 罗佳慧, 李燕, 杨成韬. Strong UV Reflecting Characteristics of Cu/Ti Superlattic Films[J]. Acta Optica Sinica, 2001, 21(6): 673.