光散射学报, 2016, 28 (3): 214, 网络出版: 2016-11-30
结合椭圆偏振光谱与傅里叶红外光谱的宽禁带半导体薄膜光学特性表征
Characterization of Optical Properties of Wide Band Gap Semiconductor Thin Film with the Combination of Ellipsometry and Infrared Spectrum
补充材料
谢灯, 丘志仁, 万玲玉, TIN Chin-che, 梅霆, 冯哲川. 结合椭圆偏振光谱与傅里叶红外光谱的宽禁带半导体薄膜光学特性表征[J]. 光散射学报, 2016, 28(3): 214. XIE Deng, QIU Zhi-ren, WAN Ling-yu, TIN Chin-che, MEI Ting, FENG Zhe-chuan. Characterization of Optical Properties of Wide Band Gap Semiconductor Thin Film with the Combination of Ellipsometry and Infrared Spectrum[J]. The Journal of Light Scattering, 2016, 28(3): 214.