光学 精密工程, 2011, 19 (7): 1437, 网络出版: 2011-08-15
斜入射干涉检测大口径碳化硅平面反射镜
Measurement of large aperture SiC flat mirrors by oblique incidence interferometry
补充材料
刘兆栋, 陈磊, 韩志刚, 严庆伟, 朱日宏. 斜入射干涉检测大口径碳化硅平面反射镜[J]. 光学 精密工程, 2011, 19(7): 1437. LIU Zhao-dong, CHEN Lei, HAN Zhi-gang, YAN Qing-wei, ZHU Ri-hong. Measurement of large aperture SiC flat mirrors by oblique incidence interferometry[J]. Optics and Precision Engineering, 2011, 19(7): 1437.