光学学报, 2017, 37 (3): 0318004, 网络出版: 2017-03-08   

超分辨定位成像中的像差表征和校正 下载: 1254次

Aberration Characterization and Correction in Super-Resolution Localization Microscopy
赵泽宇 1,2,*张肇宁 1,2黄振立 1,2
作者单位
1 华中科技大学武汉光电国家实验室Britton Chance生物医学光子学研究中心, 湖北 武汉 430074
2 华中科技大学生物医学工程系生物医学光子学教育部重点实验室, 湖北 武汉 430074
引用该论文

赵泽宇, 张肇宁, 黄振立. 超分辨定位成像中的像差表征和校正[J]. 光学学报, 2017, 37(3): 0318004.

Zhao Zeyu, Zhang Zhaoning, Huang Zhenli. Aberration Characterization and Correction in Super-Resolution Localization Microscopy[J]. Acta Optica Sinica, 2017, 37(3): 0318004.

参考文献

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赵泽宇, 张肇宁, 黄振立. 超分辨定位成像中的像差表征和校正[J]. 光学学报, 2017, 37(3): 0318004. Zhao Zeyu, Zhang Zhaoning, Huang Zhenli. Aberration Characterization and Correction in Super-Resolution Localization Microscopy[J]. Acta Optica Sinica, 2017, 37(3): 0318004.

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