光学学报, 2017, 37 (3): 0318004, 网络出版: 2017-03-08
超分辨定位成像中的像差表征和校正 下载: 1254次
Aberration Characterization and Correction in Super-Resolution Localization Microscopy
补充材料
赵泽宇, 张肇宁, 黄振立. 超分辨定位成像中的像差表征和校正[J]. 光学学报, 2017, 37(3): 0318004. Zhao Zeyu, Zhang Zhaoning, Huang Zhenli. Aberration Characterization and Correction in Super-Resolution Localization Microscopy[J]. Acta Optica Sinica, 2017, 37(3): 0318004.