反熔丝FPGA延时电路γ瞬时辐射效应
[1] Design techniques for radiation-hardened FPGAs[OL].http://www.actel.com.
[2] Wang J J,Katz R,Cronquist B,et al.Design in total ionizing dose hardening of FPGA[OL].http://www.actel.com.
[3] Cronquist B,Sarpa M,Wang J J,et al.Modification of COTS FPGA device for space application[OL].http://www.actel.com.
[4] 朱明程,熊元姣.ACTEL 数字系统现场集成技术[M].北京:清华大学出版社,2004.(Zhu M C,Xiong Y J.Technology of ACTEL digital system filed integration.Beijing:Tsinghua University Press,2004)
[5] HiRel FPGAS[OL].http://www.actel.com http://www.actel.com/documents/HiRel_DS.pdf
[6] Radiation Performance of Actel Products[OL].http://www.actel.com,2004.
杜川华, 詹峻岭, 徐曦. 反熔丝FPGA延时电路γ瞬时辐射效应[J]. 强激光与粒子束, 2006, 18(2): 321. 杜川华, 詹峻岭, 徐曦. γ transient radiation effects of antifuse-based FPGA delay circuit[J]. High Power Laser and Particle Beams, 2006, 18(2): 321.
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