Photonics Research, 2019, 7 (11): 11000B73, Published Online: Oct. 28, 2019
Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films Download: 807次
Basic Information
DOI: | 10.1364/PRJ.7.000B73 |
中图分类号: | -- |
栏目: | Semiconductor UV Photonics |
项目基金: | -- |
收稿日期: | Mar. 6, 2019 |
修改稿日期: | Jul. 29, 2019 |
网络出版日期: | Oct. 28, 2019 |
通讯作者: | C. Trager-Cowan (c.trager-cowan@strath.ac.uk) |
备注: | -- |
C. Trager-Cowan, A. Alasmari, W. Avis, J. Bruckbauer, P. R. Edwards, B. Hourahine, S. Kraeusel, G. Kusch, R. Johnston, G. Naresh-Kumar, R. W. Martin, M. Nouf-Allehiani, E. Pascal, L. Spasevski, D. Thomson, S. Vespucci, P. J. Parbrook, M. D. Smith, J. Enslin, F. Mehnke, M. Kneissl, C. Kuhn, T. Wernicke, S. Hagedorn, A. Knauer, V. Kueller, S. Walde, M. Weyers, P.-M. Coulon, P. A. Shields, Y. Zhang, L. Jiu, Y. Gong, R. M. Smith, T. Wang, A. Winkelmann. Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films[J]. Photonics Research, 2019, 7(11): 11000B73.