Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films

C. Trager-Cowan; A. Alasmari; W. Avis; J. Bruckbauer; P. R. Edwards; B. Hourahine; S. Kraeusel; G. Kusch; R. Johnston; G. Naresh-Kumar; R. W. Martin; M. Nouf-Allehiani; E. Pascal; L. Spasevski; D. Thomson; S. Vespucci; P. J. Parbrook; M. D. Smith; J. Enslin; F. Mehnke; M. Kneissl; C. Kuhn; T. Wernicke; S. Hagedorn; A. Knauer; V. Kueller; S. Walde; M. Weyers; P.-M. Coulon; P. A. Shields; Y. Zhang; L. Jiu; Y. Gong; R. M. Smith; T. Wang; A. Winkelmann

doi:doi:10.1364/PRJ.7.000B73

Photonics Research, 2019, 7 (11): 11000B73, Published Online: Oct. 28, 2019

Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films Download： 807次

C. Trager-Cowan ^1,*A. Alasmari ¹W. Avis ¹J. Bruckbauer ¹P. R. Edwards ¹B. Hourahine ¹S. Kraeusel ¹G. Kusch ¹R. Johnston ¹G. Naresh-Kumar ¹R. W. Martin ¹M. Nouf-Allehiani ¹E. Pascal ¹L. Spasevski ¹D. Thomson ¹S. Vespucci ¹P. J. Parbrook ²M. D. Smith ²J. Enslin ³F. Mehnke ³M. Kneissl ^3,4C. Kuhn ³T. Wernicke ³S. Hagedorn ⁴A. Knauer ⁴V. Kueller ⁴S. Walde ⁴M. Weyers ⁴P.-M. Coulon ⁵P. A. Shields ⁵Y. Zhang ⁶L. Jiu ⁶Y. Gong ⁶R. M. Smith ⁶T. Wang ⁶A. Winkelmann ^1,7

Author Affiliations

¹ Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG, UK

² Tyndall National Institute, University College Cork, Cork T12 R5CP, Ireland

³ Institute of Solid State Physics, Technische Universität Berlin, 10623 Berlin, Germany

⁴ Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, 12489 Berlin, Germany

⁵ Department of Electronic and Electrical Engineering, Centre of Nanoscience & Nanotechnology, University of Bath, Bath BA2 7AY, UK

⁶ Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, UK

⁷ Laser Components Department, Laser Zentrum Hannover e.V., 30419 Hannover, Germany

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C. Trager-Cowan, A. Alasmari, W. Avis, J. Bruckbauer, P. R. Edwards, B. Hourahine, S. Kraeusel, G. Kusch, R. Johnston, G. Naresh-Kumar, R. W. Martin, M. Nouf-Allehiani, E. Pascal, L. Spasevski, D. Thomson, S. Vespucci, P. J. Parbrook, M. D. Smith, J. Enslin, F. Mehnke, M. Kneissl, C. Kuhn, T. Wernicke, S. Hagedorn, A. Knauer, V. Kueller, S. Walde, M. Weyers, P.-M. Coulon, P. A. Shields, Y. Zhang, L. Jiu, Y. Gong, R. M. Smith, T. Wang, A. Winkelmann. Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films[J]. Photonics Research, 2019, 7(11): 11000B73.

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