基于X射线衍射仪的X光晶体本征参量的标定
杨国洪, 韦敏习, 侯立飞, 易涛, 李军, 刘慎业. 基于X射线衍射仪的X光晶体本征参量的标定[J]. 光子学报, 2012, 41(9): 1090.
YANG Guohong, WEI Minxi, HOU Lifei, YI Tao, LI Jun, LIU Shenye. Calibration of Characteristic Parameters for Xray Plane Crystal on the Automatic Xray Diffractometer[J]. ACTA PHOTONICA SINICA, 2012, 41(9): 1090.
[1] 郑志坚,丁永坤,丁耀兰,等.激光惯性约束聚变综合诊断系统[J].强激光与粒子束,2003,11(11): 10731076.
ZHENG Zhijian, DING Yongkun, DING Yaonan, et al. Recent progress and application of diagnostic technique in laser fusion[J].High Power Laser and Particle Beams, 2003, 11(11): 10731076.
[2] 杨国洪,张继彦,张保汉,等.金激光等离子体X射线精细结构谱研究[J].物理学报,2000,49(12):23892393.
YANG Guohong, ZHANG Jiyan, ZHANG Baohan, et al. Analysis of fine structure of xray spectra from laserirradiated gold dot[J]. Acta Phyica Sinica, 2000, 49(12): 23892393.
[3] 杨国洪,张继彦,吴泽清,等.神光II黑腔等离子体时间分辨的电子温度诊断[J].强激光与粒子束,2010,22(11):26132616.
YANG Guohong, ZHANG Jiyan, WU Zeqing, et al. Measurement of timeresolved electron temperature of plasmas for ShenguangⅡhohlraum[J]. High Power Laser and Particle Beams, 2010, 22(11): 26132616.
[4] 韦敏习,杨家敏,杨国洪.平面晶体积分衍射效率实验标定[J].强激光与粒子束,2006,18(2): 219222.
WEI Minxi, YANG Jiamin, YANG Guohong. Calibration of integral diffraction coeff icient of flat crystal[J]. High Power Laser and Particle Beams,2006, 18(2): 219222.
[5] 甘新式,杨家敏,易荣清,等. RAP晶体积分衍射效率的实验研究[J].光子学报,2009,38(4):947950.
GAN Xinshi, YANG Jiamin, YI Rongqing, et al. Experimental research on integral diffraction coefficient of RAP crystal[J]. Acta Photonica Sinica, 2009, 38(4): 947950.
[6] 甘新式,杨家敏,易荣清,等.邻苯二钾酸氢铊晶体积分衍射效率的标定[J].强激光与粒子束,2007,19(11): 18271831.
GAN Xinshi, YANG Jiamin, YI Rongqing, et al. Calibration of integral diffraction coeff icients of TlAP crystal[J]. High Power Laser and Particle Beams,2007, 19(11): 18271831.
[7] 赵佳,崔明启,赵屹东,等.Si(111)晶体峰值衍射效率的测量[J].核技术,2007, 30(6): 511514.
ZHAO Jia, CUI Mingqi, ZHAO Yidong, et al. The measurement of peak value diffraction efficiency of Si (111) crystal[J]. Nuclear Techniques, 2007, 30(6): 511514.
[8] 韦敏习.晶体谱仪定量化的初步实验研究[D].绵阳: 中国工程物理研究院,2006.
WEI Minxi. Quantitative research of the flat crystal spectrometer[D]. Mianyang: China Academy of Engineering Physics,2006.
[9] 李超荣.X射线三晶衍射及其应用[J].物理,1994,23(1): 4650.
LI Chaorong. Application of Xray triple crystal diffractmeter[J].Physics, 1994, 23(1): 4650.
[10] 孙凤荣,黑东炜,王群书,等.软X射线晶体标定系统研制[J].核电子学与探测技术,2010, 30(12): 15981601.
SUN Fengrong, HEI Dongwei, WANG Qunshu, et al. Development of a soft Xray crystal calibration system[J].Nuclear Electronics & Detection Technology, 2010, 30(12): 15981601.
[11] GILFRICH J V, BIRKS L S. Spectral distribution of Xray tubes for quantitative Xray fluorescence analysis[J]. Analytical Chemistry, 1968, 40(7): 10771080.
[12] GILFRICH J V, BROWN D B, BURKHALTER P G. Integral reflection coefficient of Xray spectrometer crystal[J]. Applied Spectroscopy, 1975, 29(4): 322326.
[13] EVANS K D, LEIGHT B. The absolute calibration of the refelction integral of Bragg xray analyzer crystalssingle reflection methods[J].Space Science Instrumentation, 1976, 2: 105123.
[14] VIERLING J, GILFRICH J V, BIRKS L S. Improving diffracting property of LiF: comparision with graphite[J]. Applied Spectroscopy, 1969, 23: 342345.
[15] REVERDIN C, MORLENS A S, ANGELIER B, et al. Xray calibration of the time resolved crystal spectrometer SXDHR1t of the ligne d′intégration laser[J].Review of Scientific Instrument,, 2004, 75(10): 37303733.
[16] ZAUMSEIL P, WINTER U, JOKSCH St, et al. Xray reflection properties of annealed silicon single crystals[J]. Review of Scientific Instrument, 1992, 63(I): 907910.
[17] BARRUS D M, BLAKE R L, FELTHAUSER H, et al. Spectrometric properties of crystals for low energy Xray diagnostics[C]. AIP Conf Proc, 1981, 75: 115123.
[18] HENKE B L, GULLIKSON E M, DAVIS J C. Xray interactions: photoabsorp tion, scattering, transmistsion and reflection at E=50~30 000 eV, Z=1~92[J]. Atomic Data and Nuclear Data Tables, 1993, 54(2): 181342.
杨国洪, 韦敏习, 侯立飞, 易涛, 李军, 刘慎业. 基于X射线衍射仪的X光晶体本征参量的标定[J]. 光子学报, 2012, 41(9): 1090. YANG Guohong, WEI Minxi, HOU Lifei, YI Tao, LI Jun, LIU Shenye. Calibration of Characteristic Parameters for Xray Plane Crystal on the Automatic Xray Diffractometer[J]. ACTA PHOTONICA SINICA, 2012, 41(9): 1090.