基于EMVA1288标准的图像传感器辐照效应参数测试系统的研制
[1] 王祖军, 唐本奇, 肖志刚, 等. CCD辐射损伤效应及加固技术研究进展[J]. 半导体光电, 2009, 30(6): 797-802.
Wang Zujun, Tang Benqi, Xiao Zhigang, et al. Progress of radiation damage effects and hardening technology on CCD[J]. Semiconductor Optoelectronics, 2009, 30(6): 797-802.
[2] 王祖军, 黄绍艳, 刘敏波, 等. CCD位移辐射效应损伤机理分析[J]. 半导体光电, 2010, 31(2): 175-179.
Wang Zujun, Huang Shaoyan, Liu Minbo, et al. Analysis of the displacement damage mechanism of radiation effects in CCD[J]. Semiconductor Optoelectronics, 2010, 31(4): 175-179.
[3] 王祖军, 刘以农, 陈伟, 等. 辐射损伤诱发CCD敏感参数退化分析[J]. 核电子学与探测技术, 2010, 30(2): 151-156.
Wang Zujun, Liu Yinong, Chen Wei, et al. The analysis of CCD sensitive parameters degraded by radiation damage[J]. Nuclear Electron. & Detection Technol., 2010, 30(2): 151-156.
[4] 王祖军.电荷耦合器件质子辐照损伤实验及数值模拟研究[D]. 北京: 清华大学, 2011.
Wang Zujun. Research on proton radiation effects on charge coupled device with experiment and simulation methods[D]. Beijing: Tsinghua University, 2011.
[5] 李豫东, 郭旗, 陆妩, 等. CCD在不同注量率电子辐照下的辐射效应研究[J]. 原子能科学技术, 2012, 46(3): 346-350.
Li Yudong, Guo qi, Lu Wu, et al. Research on electron irradiation damage effects of on charge coupled device[J]. Atomic Energy Science and Technol., 2012, 46(3): 346-350.
[6] 王祖军, 林东生, 刘敏波, 等. CMOS图像传感器的辐照损伤效应[J]. 半导体光电, 2014, 35(6): 945-950.
[7] 王祖军, 刘静. CMOS图像传感器总剂量辐照效应及加固技术研究进展[J]. 半导体光电, 2017, 38(1): 1-7.
[8] 李豫东, 汪波, 郭旗, 等. CCD与CMOS图像传感器辐射效应测试系统[J]. 光学精密工程, 2013, 21(11): 2778-2784.
[9] 周跃, 闫丰, 章明朝. CCD光电参数测试系统的研制[J]. 红外与激光工程, 2014, 43(10): 3451-3456.
Zhou Yue, Yan Feng, Zhang Mingchao. Development of measurement instrument for photoelectric parameters of CCD[J]. Infrared and Laser Eng., 2014, 43(10): 3451-3456.
[10] European Machine Vision Association. Standard for characterization of image sensors and cameras, EMVA Standard 1288, Release 3.0[S]. 2010.
王祖军, 薛院院, 姚志斌, 马武英, 何宝平, 刘敏波, 盛江坤. 基于EMVA1288标准的图像传感器辐照效应参数测试系统的研制[J]. 半导体光电, 2017, 38(4): 515. WANG Zujun, XUE Yuanyuan, YAO Zhibin, MA Wuying, HE Baoping, LIU Minbo, SHENG Jiangkun. Development of Image Sensor Radiation Effect Parameters Testing System Based on EMVA1288 Standard[J]. Semiconductor Optoelectronics, 2017, 38(4): 515.
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