作者单位
摘要
1 广东工业大学自动化学院, 广东 广州 510006
2 广西大学计算机电子信息学院, 广西 南宁 530004
提出一种面向光刻掩模优化框架基于半隐式离散化的数值技术方法,对框架中稳定时间相关模型中的扩散项、非扩散项分别进行隐式、显式的离散化 ,从而克服基于梯度下降的显式离散化方法中迭代步长受到抑制的稳定性约束要求。此外,选择对掩模图形的边缘与高频成分相对应的受监控像素点进行局部优化,而不是优化所有的掩模像素点,来降低计算复杂度。仿真结果显示,所提掩模优化算法在降低优化维度的同时提高了优化收敛效率。
成像系统 光刻 掩模优化 半隐式 水平集 光学临近校正 
光学学报
2021, 41(9): 0911004
Author Affiliations
Abstract
1 Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China
2 Key Laboratory of Time and Frequency Primary Standards, National Time Service Center, Chinese Academy of Sciences, Xi’an 710600, China
A vapor cell provides a well-controlled and stable inner atmosphere for atomic sensors, such as atomic gyroscopes, atomic magnetometers, and atomic clocks, and its hermeticity affects the stability and aging of atomic sensors. We present the micro-fabrication of a micro-electromechanical system wafer-level hermit vapor cell based on deep reactive ion etching and vacuum anodic-bonding technology. The anodic-bonding process with the voltage increasing in steps of 200 V had a critical influence on vapor cell hermeticity. Further, the silicon–glass bonding surface was experimentally investigated by a scanning electron microscope, which illustrated that there were no visual cracks and defects in the bonding surface. The leak rate was measured using a helium leak detector. The result shows that the vapor cells with different optical cavity lengths comply with the MIL-STD-883E standard (5 × 10 8 mbar·L/s). Moreover, D2 absorption spectroscopy was characterized via optical absorption. The bonding strength was determined to be 13 MPa, which further verified the quality of the vapor cells.
020.1335 Atom optics 020.1670 Coherent optical effects 110.3960 Microlithography 300.6460 Spectroscopy, saturation 
Chinese Optics Letters
2019, 17(10): 100201
Author Affiliations
Abstract
1 Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China
2 Key Laboratory of Time and Frequency Primary Standards, National Time Service Center, Chinese Academy of Sciences, Xi’an 710600, China
As the key part of chip-scale atomic clocks (CSACs), the vapor cell directly determines the volume, stability, and power consumption of the CSAC. The reduction of the power consumption and CSAC volumes demands the manufacture of corresponding vapor cells. This overview presents the research development of vapor cells of the past few years and analyzes the shortages of the current preparation technology. By comparing several different vapor cell preparation methods, we successfully realized the micro-fabrication of vapor cells using anodic bonding and deep silicon etching. This cell fabrication method is simple and effective in avoiding weak bonding strengths caused by alkali metal volatilization during anodic bonding under high temperatures. Finally, the vapor cell D2 line was characterized via optical-absorption resonance. According to the results, the proposed method is suitable for CSAC.
020.1335 Atom optics 020.1670 Coherent optical effects 110.3960 Microlithography 
Chinese Optics Letters
2019, 17(4): 040202
作者单位
摘要
1 中国科学院上海光学精密机械研究所信息光学与光电技术实验室, 上海 201800
2 中国科学院大学, 北京 100049
提出一种基于阶梯相位环空间像主成分分析的光刻投影物镜波像差检测方法。通过对相位环空间像进行主成分分析和多元线性回归分析,构建了空间像光强分布与波像差之间的线性模型,并基于该模型实现了波像差检测。与使用孤立空检测标记的传统方法相比,使用新检测标记能够消除不同种类波像差之间的串扰问题,提高像差检测精度。同时,分析了空间像的离焦误差对波像差检测精度的影响,并提出了一种迭代算法用于确定实测空间像的离焦误差,其测量精度优于1 nm。光刻仿真软件Dr.LiTHO的仿真结果表明,该法有能力检测12项泽尼克系数(Z5~Z16),最大系统误差约为1×10-3λ,检测速度可提高一倍以上。
成像系统 光刻 波像差检测 相位环 主成分分析 空间像 
光学学报
2014, 34(2): 0211004
Author Affiliations
Abstract
The impact of lens aberrations becomes severe when the critical dimensions (CDs) shrink. The accurate measurement of both low- and high-order Zernike aberrations is important during a photolithographic process. Based on the multi-illumination settings and principal component analysis of aerial images, a novel in situ aberration measurement technique that can accurately measure all the Zernike aberrations, except for the sinusoidal 2-\theta and sinusoidal 4-\theta terms (under polar coordinates, and Z1 to Z4 are not considered) is proposed in this letter. The estimated maximum error of the Zernike aberrations ranges from 0.43 to 0.78 m\lambda when the amplitudes of the Zernike coefficients range from –20 to 20 m\lambda. The standard and root mean square errors are both in the range from 0.14 to 0.4 m\lambda.
110.3960 Microlithography 120.3940 Metrology 220.1010 Aberrations (global) 
Chinese Optics Letters
2012, 10(12): 121202
作者单位
摘要
1 中国科学院上海光学精密机械研究所信息光学实验室,上海 201800
2 中国科学院研究生院,北京 100039
随着光刻特征尺寸的不断减小,硅片表面不平度对光刻性能的影响越来越显著.该文提出了一种新的硅片表面不平度的原位检测技术本文在分析特殊测试标记成像规律的基础上,讨论了测试标记的对准位置偏移量与硅片表面起伏高度的变化规律,提出了一种新的硅片表面不平度原位检测技术.实验表明,该技术可实现硅片表面不平度及硅片表面形貌的高准确度原位测量.该技术考虑了光刻机承片台吸附力的非均匀性对硅片表面不平度的影响,更真实反映曝光工作状态下的硅片表面不平度大小.与现有的原位检测方法相比,硅片表面不平度的测量空间分辨率提高了1.67%倍,可实现硅片表面形貌的原位检测.
硅片表面不平度 FOCAL技术 光刻机 原位检测 Wafer flatness FOCAL technique Optical microlithography In-situ measurement 
光子学报
2006, 35(12): 1975
作者单位
摘要
1 中国科学院上海光学精密机械研究所信息光学实验室, 上海 201800
2 中国科学院研究生院,北京 100039
套刻性能是现代高精度步进扫描投影光刻机的重要性能指标之一。提出了一种基于镜像焦面检测对准标记(简称“镜像焦面检测对准标记”)的光刻机套刻性能原位测量技术。该技术通过对曝光在硅片上的镜像焦面检测对准标记图形进行光学对准,利用标记图形对准位置与理想位置偏差实现套刻性能的原位检测。实验结果表明该技术在进行套刻误差的精确测量的同时还可以全面、定量地计算影响光刻机单机套刻误差的场内参量及场间参量。与目前套刻性能原位测量技术相比,该技术有效地避免了测量精度对轴向像质限制的依赖,简化了光刻机整机性能检测的过程。
光学测量 原位检测 套刻性能 光刻机 焦面检测对准标记 
光学学报
2006, 26(3): 398
Author Affiliations
Abstract
1 State Key Laboratory of Optical Technology for Microfabrication, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209
2 Graduate School of the Chinese Academy of Sciences, Beijing 100039
The fundamental resolution limit and depth of focus of immersion lithography are described. The image contrasts for TE polarization, TM polarization, and unpolarized condition are explored in detail. There are complications associated with diffraction orders incident on the resist at large incident angles. Image contrast can be improved or degraded depending on the choice of polarization states. The influence of polarization on processing windows for 65 and 45 nm 1:1 line/space patterns is studied by simulation. It shows the use of vector image lithography simulator to quantify exposure-focus processing window improvements for TE polarization as compared with TM polarization. The results show that the full resolution capabilities of immersion lithography systems can only be realized when the polarization control is used.
110.3960 Microlithography 110.5220 Photolithography 110.2960 Image analysis 260.5430 Polarization 350.5730 Resolution 
Chinese Optics Letters
2005, 3(0s): 198
作者单位
摘要
中国科学院上海光学精密机械研究所光学薄膜技术与研究发展中心, 上海 201800
193 nm光学薄膜是100 nm步进扫描光刻机系统中主要用到的光学薄膜。分析了膜料光学常数的不确定性、高折射率膜材料消光系数、水吸收以及膜层表面粗糙度对薄膜光学性能的影响。结果表明,要镀制出反射率大于98.5%的高反膜,必须将高折射率材料的消光系数k控制在0.0034以内,同时膜层表面的粗糙度σ控制在1 nm以内。膜层性能同时还受其使用环境中水气含量及其水气中杂质含量的影响,要减少膜层水吸收的影响,就必须提高薄膜的致密度,采用离子成膜技术,或者改变膜层的使用环境。在考虑相关因素的前提下,设计了在光刻机曝光系统中主要用到的增透膜、高反膜,并分析了其实际性能与设计结果存在差别的原因。
薄膜技术 193 nm光学薄膜 光刻机 消光系数 水吸收 表面粗糙度 
中国激光
2004, 31(4): 477
Author Affiliations
Abstract
1 State Key Lab for Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033
2 Graduate School of the Chinese Academy of Sciences, Beijing 100039
3 Aviation University of Air Force, Changchun 130022
The imagequality evaluation in fiber-optic image bundles was addressed by the modulation transfer function (MTF). With the definition of the contrast transfer function (CTF), the MTF model of line-array fiber-optic image bundles was established and analyzed numerically. The average MTF was carefully evaluated by considering the influence of phase match on the MTF between input pattern and fiber-optic image bundles. In this paper, the average MTF is mean arithmetical value on the MTFs of eight different phases. The results show that, for certain fiber diameter and spatial frequency, the relationship between the core diameter and the average MTF is inverse proportion; for certain fiber cladding thickness, the relationship between the core diameter and the average MTF is also inverse proportion. And at Nyquist frequency, the MTF value is near 0.5.
060.2360 fiber optics links and subsystems 110.4100 microlithography 350.5030 phase 
Chinese Optics Letters
2004, 2(8): 08453

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