作者单位
摘要
深圳大学物理与光电工程学院光电子器件与系统教育部/广东省重点实验室,广东 深圳 518060
门控分幅相机工作过程中,选通脉冲传输衰减效应会大幅度削弱微通道板(MCP)微带线的增益,影响相机性能。本文建立了选通电压脉冲在MCP微带线上的传输衰减模型,对MCP增益均匀性进行了理论模拟。模拟结果表明,电压脉冲在MCP微带传输时,其幅值呈指数式衰减。当衰减系数为0.0041 Np/mm时,电压幅值在40 mm处衰减至原来的85%,MCP增益衰减至原来的29%。模拟了直流电压补偿、微带末端反射补偿及宽度渐变微带线补偿这三种方法对MCP增益均匀性的影响。结合三种补偿方法得到微带线补偿模型;当微带线最小宽度取4 mm时,电压传输幅值维持在94%以上,MCP增益维持在66%。
超快光学 超快诊断 微通道板 增益均匀性 脉冲衰减 微带线 
激光与光电子学进展
2022, 59(23): 2332001
Author Affiliations
Abstract
National Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science, Shanghai 201800,China
Amplified spontaneous emission (ASE) causes the decrease of the inverted population density and the nonuniformity of gain in slab amplifier for high power laser systems. In this paper, a three dimension model, based on the data in SG-II, in which the residual reflection in the cladding and the ASE process are taken into consideration, is built to analyze the space distribution and time evolution of small signal gain coefficient using Monte Carlo algorithm and ray tracing. This model has been verified by comparing with the experimental data. The traverse size of slab is 68.2cm×36.3cm, which is usually decided by the clear aperture and the manufacture. By means of the model, the impact of thickness, residual reflectivity and the stimulated cross section of neodymium glass to the ASE are analyzed in detail.
laser amplifier amplified spontaneous emission Monte Carlo small signal gain coefficient gain uniformity 
Collection Of theses on high power laser and plasma physics
2016, 14(1): 9255
Author Affiliations
Abstract
1 Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
2 University of Chinese Academy of Sciences, Beijing 100049, China
The processing method applied to the side surface is different from the method applied to the light pass surface in neodymium phosphate glass (Nd:glass), and thus subsurface defects remain after processing. The subsurface defects in the side surface influence the gain uniformity of Nd:glass, which is a key factor to evaluate the performance of amplifiers. The scattering characteristics of side subsurface defects were simulated by finite difference time domain (FDTD) Solutions software. The scattering powers of the glass fabricated by a computer numerical control (CNC) machine without cladding were tested at different incident angles. The trend of the curve was similar to the simulated result, while the smallest point was different with the complex true morphology. The simulation showed that the equivalent residual reflectivity of the cladding glass can be more than 0.1% when the number of defects in a single gridding is greater than 50.
cladding cladding FDTD FDTD gain uniformity gain uniformity subsurface defect subsurface defect 
High Power Laser Science and Engineering
2016, 4(1): 010000e9
Author Affiliations
Abstract
1 National Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
2 University of Chinese Academy of Sciences, Beijing 100049, China
According to the problem of gain medium cross section high illumination and non-uniformity, which is caused by the laser rod amplifier non-imaging pump style. Orthogonal test design method is used to research the effect of absorption coefficient, gain medium radius, number of xenon lamps, center distance of xenon lamps and gain medium on gain uniformity. The rod amplifier which is made up by the above four elements, its gain medium cross section illumination distribution is simulated by ASAP. The results show that center distance of xenon lamps and gain medium, number of xenon lamps have very little influence on the gain uniformity. When absorption coefficient equal to 5.1 cm-1, gain uniformity will reach the optimum. Under the circumstance of other three elements are equal, the bigger is the gain radius, the smaller slope reflection curve, and the better gain uniformity.
non-imaging rod amplifier gain uniformity gain medium xenon lamp illumination absorption coefficient orthogonal test design method 
Collection Of theses on high power laser and plasma physics
2015, 13(1): 96210M
作者单位
摘要
中国工程物理研究院激光聚变研究中心,四川 绵阳 621900
惯性约束聚变(ICF)激光驱动器中,准确测定片状放大器系统增益均匀性是装置系统设计的基础。本文基于CCD成像法实验测量了我国第一台单束输出能量超过万焦耳的ICF激光驱动器—大口径高通量验证实验平台片状放大器在5.28%/cm高增益情况下的增益均匀性。实验结果表明,在平均小信号增益系数为5.28%/cm情况下,通光口径范围内增益均匀性为1.09∶1(最大值/平均值),360 mm×360 mm光束口径范围内增益均匀性为1.06∶1,满足装置19.6 kJ/5ns大能量输出设计要求。
激光器 片状放大器 增益均匀性 CCD成像法 实验测量 
光学学报
2015, 35(s2): s214003
作者单位
摘要
中国工程物理研究院激光聚变研究中心, 四川 绵阳 621900
利用大口径高通量实验平台,同时使用科学光电耦合器件(CCD)和哈特曼测量了大口径片状放大器增益均匀性,并针对这两种测量方法提出了几种相应的处理方法,通过数值计算和分析,详细比较了不同测量方法和后期处理方法对增益均匀性产生的影响,确定了两种测量方法及其后期处理方法的有效性。结果表明,使用科学CCD测量增益均匀性,数据处理时采用多发次求平均再匀滑的方法既可规避测量产生的随机性,又进一步减小了增益分布的空间噪音;使用哈特曼测量增益均匀性,尽量使用点阵超过50×50的哈特曼,微透镜阵列点阵数量过少会降低增益塌边程度。
测量 大口径片状放大器 增益均匀性 测量方法 
中国激光
2014, 41(s1): s108001
作者单位
摘要
1 中国工程物理研究院高温高密度等离子体物理国家重点实验室 绵阳 62190 0
2 中国工程物理研究院高温高密度等离子体物理国家重点实验室 绵阳 621900
介绍了一台新型大口径片状放大器的实验研究以及放大器的结构组成。利用多束探针光系统测试了大口径片状放大器通光口径方向上的增益均匀性,不同抽运条件下的实验结果表明,在22kV正常工作电压下,大口径片状放大器全口径的增益均匀性为1.06:1。
大口径片状放大器 多束探针光系统 增益均匀性 
中国激光
2001, 28(4): 355

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