Author Affiliations
Abstract
1 State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
2 Remote Sensing Laboratory, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031
3 College of Physics Science and Technology, China University of Petroleum, Qingdao 266555
A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry. With the polarization-resolved transmission spectrum (PRTS) curve, the phase retardation of quartz wave plate can be determined at a wide spectral range from 200 to 2000 nm obviously. Through accurate judgment of extreme points of PRTS curve at long-wave band, the physical thickness of quartz wave plates can be obtained exactly. We give a measuring example and the error analysis. It is found that the measuring precision of thickness is mainly determined by the spectral resolution of spectrometer.
色偏振干涉 石英波片 双折射率色散 延迟量 厚度测量 120.4630 Optical inspection 120.5050 Phase measurement 120.6200 Spectrometers and spectroscopic instrumentation Chinese Optics Letters
2006, 4(12): 705
