A spectroscopic method for determining thickness of quartz wave plate

Weiwei Feng; Lihuang Lin; Ligang Chen; Huafeng Zhu; Ruxin Li; Zhizhan Xu

Chinese Optics Letters, 2006, 4 (12): 705, Published Online: Dec. 30, 2006

A spectroscopic method for determining thickness of quartz wave plate Download： 710次

论文大纲

Weiwei Feng ¹Lihuang Lin ¹Ligang Chen ²Huafeng Zhu ³Ruxin Li ¹Zhizhan Xu ¹

Author Affiliations

¹ State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800

² Remote Sensing Laboratory, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031

³ College of Physics Science and Technology, China University of Petroleum, Qingdao 266555

色偏振干涉石英波片双折射率色散延迟量厚度测量 120.4630 Optical inspection 120.5050 Phase measurement 120.6200 Spectrometers and spectroscopic instrumentation

Abstract

A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry. With the polarization-resolved transmission spectrum (PRTS) curve, the phase retardation of quartz wave plate can be determined at a wide spectral range from 200 to 2000 nm obviously. Through accurate judgment of extreme points of PRTS curve at long-wave band, the physical thickness of quartz wave plates can be obtained exactly. We give a measuring example and the error analysis. It is found that the measuring precision of thickness is mainly determined by the spectral resolution of spectrometer.

References

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Weiwei Feng, Lihuang Lin, Ligang Chen, Huafeng Zhu, Ruxin Li, Zhizhan Xu. A spectroscopic method for determining thickness of quartz wave plate[J]. Chinese Optics Letters, 2006, 4(12): 705.

A spectroscopic method for determining thickness of quartz wave plate Download： 710次

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