半导体光电, 2016, 37 (3): 430, 网络出版: 2016-09-14
512×6 TDI长波红外探测器成像系统参数测试研究
Parameters Test of Long Wave Infrared Imaging System Based on 512×6 TDI Detector
摘要
长波红外成像系统以512×6 TDI探测器为核心器件, 联合旋转扫描镜转动实现大范围场景观测。参考红外焦平面阵列测试的国家标准GB/T 17444-2013, 对512×6 TDI长波红外探测器成像系统的主要性能参数进行测试。测试参数包括响应率、响应率不均匀性、噪声电压、噪声等效温差、有效像元率、动态范围等。介绍了各个参数的测试方法, 总结参数测试的顺序流程, 研究了不同的测试条件对测试结果的影响。参数测试中利用Matlab软件进行数据处理分析, 为了使测试方法具有更好的扩展性和移植性, 在软件编程时应注意模块化、可视化设计。文章还探讨了将参数测试算法模块嵌入成像系统的图像采集设备中进行在线自动化测试的可行性。
Abstract
The long wave infrared imaging system comprising the key device of 512×6 TDI detector, combines with the scanning mirror to realize the large range observation. Based on the national standard of infrared focal plane arrays test with the No.GB/T 17444-2013, the main performance parameters of responsivity non-uniformity, noise voltage, the noise equivalent temperature difference, the effective pixel factor and dynamic range were tested. The measuring method was described, and the measurement sequence and process were discussed. The influence of different gain state on test results was summarized. The test data were analyzed using Matlab software. In order to extend and transplant the test method better, the modular and visual design was specially described. The GUI tool of Matlab provides a good design environment, and the design becomes simple and feasible. The feasibility of online automatic parameter testing was discussed. If we can put the parameter calculation algorithm embedded into the image data acquisition device software of the imaging system, online real-time test will be possible and the test efficiency will be greatly improved.
刘冰, 王杰, 董建婷. 512×6 TDI长波红外探测器成像系统参数测试研究[J]. 半导体光电, 2016, 37(3): 430. LIU Bing, WANG Jie, DONG Jianting. Parameters Test of Long Wave Infrared Imaging System Based on 512×6 TDI Detector[J]. Semiconductor Optoelectronics, 2016, 37(3): 430.