激光与光电子学进展, 2018, 55 (10): 100401, 网络出版: 2018-10-14
CMOS相机光电参数的测试方法 下载: 1274次
Test Method of Optoelectronic Parameters of CMOS Camera
探测器 光电器件 转换增益 最大信噪比 暗噪声 detectors optoelectronic devices conversion gain maximum signal-to-noise ratio dark noise
摘要
通过分析互补性氧化金属半导体(CMOS)相机的信号传递模型, 建立了CMOS相机信号与噪声间的传递函数模型, 推导了相机输出图像信号与图像噪声间的线性关系。搭建了相机性能参数测试系统, 对CMOS相机的转换增益、最大信噪比、时域暗噪声进行了测试, 并将实测值与指标值进行了对比。研究结果表明, 所提测试方法能较精确地测出相机的性能参数, 适用于大部分型号相机光电参数的测试。
Abstract
By the analysis of the signal transfer model of a complementary metal oxide semiconductor (CMOS) camera, the transfer function model of signals and noises in this CMOS camera is builded and the linear relationship between the output image signal and the image noise of this camera is deduced. The testing system of the performance parameters of this camera is established, and the conversion gain, the maximum signal-to-noise ratio (SNR) and the dark noise in time domain of this CMOS camera are tested. The test value is compared with the index value, and the results show that, the performance parameters of this camera can be can accurately tested with this proposed test method, which is suitable for the test of the photoelectric parameters of most types of cameras.
李洪博, 刘云清, 宋延嵩, 董岩. CMOS相机光电参数的测试方法[J]. 激光与光电子学进展, 2018, 55(10): 100401. Li Hongbo, Liu Yunqing, Song Yansong, Dong Yan. Test Method of Optoelectronic Parameters of CMOS Camera[J]. Laser & Optoelectronics Progress, 2018, 55(10): 100401.