表面形貌检测是工业生产和科学研究所需的关键技术之一，高精度和高效率是该领域一直以来的发展方向。光学频率梳有着独特宽光谱、窄线宽和稳定频率的特性，展现了优越的计量潜力，在表面形貌测量领域有着重要的应用并取得了重要的进展。首先介绍了光学频率梳的定义；根据不同的技术路线，分类回顾了光学频率梳在形貌测量中的研究现状及特点；最后，对基于光频梳的形貌测量技术进行了展望。

Surface topography measurement is one of the key technologies for industrial production and scientific research, and the pursuit of high accuracy and high efficiency has always been the direction of the field. With its unique broad spectrum, narrow linewidth, and stable frequency characteristics, optical frequency combs show superior metrology potential and have been developed for a variety of topography measurement techniques. First, the definition of optical frequency combs is introduced; the current research status and characteristics of optical frequency combs in topography measurement are categorized and reviewed according to different technical lines; finally, the outlook of optical frequency comb-based topography measurement techniques is presented.