为了解决传统双折射测量系统在调节光学元件的过程中,结构复杂、耗时长且不状态稳定的问题, 采用计算偏振跳变曲线中o光和e光低电平占空比的方法, 增加了自动旋转波片的功能, 优化出一套具有较高工作效率的双折射测量系统。该系统可自动调整波片快轴方向, 使其可对准激光器的本征偏振方向, 减少了人为判断波片快轴时可能引入的测量误差。结果表明,波片相位延迟的最大偏差为0.65°, 标准差降低28%。双折射测量系统的测量精度及稳定性满足工业化生产的要求。

In order to solve the problem of complex structure, time-consuming and unstable state in the process of adjusting optical elements in a traditional birefringence measurement system, the duty cycles of o light and e light at low levels in polarization flipping curves were calculated. The function of automatic rotating wave-plate was added in a birefringence measurement system optimized with high efficiency. The system can automatically adjust the direction of fast axis of the wave-plate aligned with the intrinsic polarization direction of laser and reduce the measurement error that may be introduced when judging the fast axis of wave-plate artificially. After many measurements, the results show that the maximum deviation of wave-plate phase delay is 0.65°, and the standard deviation is reduced by 28%. The measurement accuracy and stability of birefringence measurement systems have met the requirements of industrial production.