光电技术应用, 2011, 26 (4): 81, 网络出版: 2011-09-09
电子设备可靠性的加速试验
Reliability Accelerated Testing(RAT)for Electronic Equipments
可靠性加速试验 高加速寿命试验 高加速应力筛选试验 reliability accelerated testing highly accelerated life testing highly accelerated stress screening
摘要
简要介绍了可靠性加速试验基本原理和一般流程,以及可靠性试验技术形成和发展。提出了可靠性加速试验的实施规划,并重点阐述了可靠性加速试验中的高加速寿命试验( HALT)和高加速应力筛选试验(HASS)的相关内容,详细介绍了两者的区别和实施方法。针对试验应力类型选择、试验层次和试验条件的确定等方面进行了说明,给出了基本应用原则。最后就开展可靠性加速试验中专业人员协同工作以及数据库建立给出了一些建议。
Abstract
The basic principle and general process of the reliability accelerated testing (RAT) are introduced,the formation and development of the reliability testing technique are also introduced. The implementation plan of the reliability accelerated testing is proposed. The highly accelerated life testing (HATL) and highly accelerated stress screening (HASS) are discussed,their differences and implementation methods are described. The testing stress type,level and condition are explained,and the basic principle of the application is given. Some advice is given to the cooperative staffs and the establishment of the database.
张秋菊, 刘承禹. 电子设备可靠性的加速试验[J]. 光电技术应用, 2011, 26(4): 81. ZHANG Qiu-ju, LIU Cheng-yu. Reliability Accelerated Testing(RAT)for Electronic Equipments[J]. Electro-Optic Technology Application, 2011, 26(4): 81.