线宽压窄和频率锁定是提高激光器(特别是半导体激光器)性能的重要手段。在理论分析光反馈时的半导体激光器线宽压窄和频率锁定机理的基础上,建立了一套基于高品质V型光学谐振腔的半导体激光器线宽压窄实验系统,并利用该系统开展了初步实验研究。通过对比无有光反馈情况下的V型腔的透射光扫描线形,初步验证了V型腔用于半导体激光器线宽压窄和频率锁定的可行性,为后续研究奠定了基础。

Linewidth reduction and frequency locking are two important techniques to enhance the quality of lasers, especially semiconductor lasers. On the basis of theoretical analysis about linewidth reduction and frequency locking of semiconductor lasers with optical feedback, this paper establishes an experimental system of linewidth reduction for semiconductor lasers basing on high-quality V-shaped cavity and preliminary experimental research was conducted using the system. By comparison of scanning features of transmitted light of the V-shaped resonant cavity between with and without optical feedback, the feasibility of using V-shaped cavity to reduce linewidth and lock frequency of semiconductor lasers is basically validated, laying the foundation for further research.