光学 精密工程, 2020, 28 (1): 50, 网络出版: 2020-03-25
荧光成像技术无损探测光学元件亚表面缺陷
Nondestructive detection of optics subsurface defects by fluorescence image technique
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刘红婕, 王凤蕊, 耿峰, 周晓燕, 黄进, 叶鑫, 蒋晓东, 吴卫东, 杨李茗. 荧光成像技术无损探测光学元件亚表面缺陷[J]. 光学 精密工程, 2020, 28(1): 50. LIU Hong-jie, WANG Feng-rui, GENG Feng, ZHOU Xiao-yan, HUANG Jin, YE Xin, JIANG Xiao-dong, WU Wei-dong, YANG Li-ming. Nondestructive detection of optics subsurface defects by fluorescence image technique[J]. Optics and Precision Engineering, 2020, 28(1): 50.
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