强激光与粒子束, 2009, 21 (6): 835, 网络出版: 2009-11-24
光学元件亚表面缺陷的全内反射显微检测
Total internal reflection microscopy:a subsurface defects identification technique in optically transparent components
引用该论文
邓燕, 许乔, 柴立群, 徐建程, 石琦凯, 罗晋. 光学元件亚表面缺陷的全内反射显微检测[J]. 强激光与粒子束, 2009, 21(6): 835.
Deng Yan, Xu Qiao, Chai Liqun, Xu Jiancheng, Shi Qikai, Luo Jin. Total internal reflection microscopy:a subsurface defects identification technique in optically transparent components[J]. High Power Laser and Particle Beams, 2009, 21(6): 835.
邓燕, 许乔, 柴立群, 徐建程, 石琦凯, 罗晋. 光学元件亚表面缺陷的全内反射显微检测[J]. 强激光与粒子束, 2009, 21(6): 835. Deng Yan, Xu Qiao, Chai Liqun, Xu Jiancheng, Shi Qikai, Luo Jin. Total internal reflection microscopy:a subsurface defects identification technique in optically transparent components[J]. High Power Laser and Particle Beams, 2009, 21(6): 835.
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