激光与光电子学进展, 2014, 51 (1): 011202, 网络出版: 2014-01-03   

基于迭代梯度算法的子孔径拼接检测技术研究 下载: 620次

Research on Sub-Aperture Stitching Testing Technology Based on Iterative Gradient Algorithm
作者单位
1 中国科学院长春光学精密机械与物理研究所 光学系统先进制造技术重点实验室, 吉林 长春 130033
2 中国科学院大学, 北京 100049
引用该论文

郑立功, 闫力松, 王孝坤, 薛栋林, 胡海翔, 张学军. 基于迭代梯度算法的子孔径拼接检测技术研究[J]. 激光与光电子学进展, 2014, 51(1): 011202.

Zheng Ligong, Yan Lisong, Wang Xiaokun, Xue Donglin, Hu Haixiang, Zhang Xuejun. Research on Sub-Aperture Stitching Testing Technology Based on Iterative Gradient Algorithm[J]. Laser & Optoelectronics Progress, 2014, 51(1): 011202.

参考文献

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郑立功, 闫力松, 王孝坤, 薛栋林, 胡海翔, 张学军. 基于迭代梯度算法的子孔径拼接检测技术研究[J]. 激光与光电子学进展, 2014, 51(1): 011202. Zheng Ligong, Yan Lisong, Wang Xiaokun, Xue Donglin, Hu Haixiang, Zhang Xuejun. Research on Sub-Aperture Stitching Testing Technology Based on Iterative Gradient Algorithm[J]. Laser & Optoelectronics Progress, 2014, 51(1): 011202.

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