中国激光, 1993, 20 (5): 349, 网络出版: 2007-12-07
半导体激光器端面剩余模式反射率测量结果的分析
Analysis of measurement results of residual reflectivity at AR coated facets of semiconductor lasers
半导体激光器 光栅单色仪 调制度 端面剩余模式反射率 semiconductor laser diode grating monochramator modulation index normalised passband width
摘要
本文分析了单色仪出射狭缝宽度对半导体激光器镀膜端面反射率测量的影响,理论预言了调制度和反射率的测量值以及测量谱中波峰和波谷的位置随缝宽周期性变化的规律。实验结果证实了理论预测的正确性。
Abstract
Westbrook's theory has been adopted to analyse.the effects of a grating monochramator on the measurement of modal reflectivity at AR coated facets of a semiconductor laser diode. It has been verified that the measured modulation index and reflectivity changes with the exit slit width periodically. The period has been identified to correspond to the diode mode spacing. The analysis has also predicted that when the passband width of the monochramator is somewhat larger than the diode mode spacing, the measured peaks and valleys will be different from their real positions by a half of the mode spacing.
参考文献
武岚, 罗斌, 陈建国, 卢玉村. 半导体激光器端面剩余模式反射率测量结果的分析[J]. 中国激光, 1993, 20(5): 349. 武岚, 罗斌, 陈建国, 卢玉村. Analysis of measurement results of residual reflectivity at AR coated facets of semiconductor lasers[J]. Chinese Journal of Lasers, 1993, 20(5): 349.