光学学报, 2020, 40 (1): 0111023, 网络出版: 2020-01-06  

基于单幅图像的集成电路引脚共面性检测方法 下载: 1216次

Coplanarity Inspection Method for Integrated Circuit Pins Based on Single Image
作者单位
汕头大学智能制造技术教育部重点实验室, 广东 汕头 515063
引用该论文

吴福培, 朱树锴, 李昇平. 基于单幅图像的集成电路引脚共面性检测方法[J]. 光学学报, 2020, 40(1): 0111023.

Fupei Wu, Shukai Zhu, Shengping Li. Coplanarity Inspection Method for Integrated Circuit Pins Based on Single Image[J]. Acta Optica Sinica, 2020, 40(1): 0111023.

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吴福培, 朱树锴, 李昇平. 基于单幅图像的集成电路引脚共面性检测方法[J]. 光学学报, 2020, 40(1): 0111023. Fupei Wu, Shukai Zhu, Shengping Li. Coplanarity Inspection Method for Integrated Circuit Pins Based on Single Image[J]. Acta Optica Sinica, 2020, 40(1): 0111023.

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