基于单幅图像的集成电路引脚共面性检测方法 下载: 1216次
吴福培, 朱树锴, 李昇平. 基于单幅图像的集成电路引脚共面性检测方法[J]. 光学学报, 2020, 40(1): 0111023.
Fupei Wu, Shukai Zhu, Shengping Li. Coplanarity Inspection Method for Integrated Circuit Pins Based on Single Image[J]. Acta Optica Sinica, 2020, 40(1): 0111023.
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吴福培, 朱树锴, 李昇平. 基于单幅图像的集成电路引脚共面性检测方法[J]. 光学学报, 2020, 40(1): 0111023. Fupei Wu, Shukai Zhu, Shengping Li. Coplanarity Inspection Method for Integrated Circuit Pins Based on Single Image[J]. Acta Optica Sinica, 2020, 40(1): 0111023.