[1] . V. Tikhonravov, P. W. Baumeister, K. V. Popov. Phase properties of multilayers[J]. Appl. Opt., 1997, 36(19): 4391.

[2] . Schwider, L. Zhou. Dispersive interferometric profilometer[J]. Opt. Lett., 1994, 19: 995-997.

[3] . Thin-film thickness profile and its refractiveindex measurements by dispersive white-lightinterferometry[J]. Opt. Express, 2006, 14(24): 11885-11891.

[4] . M. Smith, C. C. Dobson. Absolute displacement measurement using modulation of the spectrum of white light in a Michelson interferometer[J]. Appl. Opt., 1989, 28: 3339-3342.

[5] http:∥www.veeco.com/pdfs/appnotes/AN542_Dektak_Vision_Final_447.pdf

[6] . A. Henck, W. M. Duncan, L. M. Lowenstein et al.. In situ spectral ellipsometry for real-time thickness measurement: Etching multilayer stacks[J]. J. Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1993, 11: 1179-1185.

[7] . Hlubina. Dispersive white-light spectra linterferometry with absolute phase retrieval to measure thin film[J]. Opt. Express, 2006, 14(17): 7678-7685.

[8] Young-Sik Ghim, Seung-Woo Kim. Dispersive white-light interferometry for thin-film thickness profile measurement[C]. SPIE, 2005, 5856: 419～426

[9] http:∥www.veeco.com/pdfs/appnotes/an47_interferometry_21.pdf

[10] . Naganuma, K. Mogi, H. Yamada. Group-delay measurement using the Fourier transform of an interferometric cross correlation generated by white light[J]. Opt. Lett., 1990, 15(17): 393-397.

[11] . Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser[J]. Opt. Lett., 2007, 32(6): 647-649.

[12] http:∥www.oceanoptics.com/

[13] 蒋毅,曹庄琪,沈启舜 等. 导波法测量吸收薄膜的复介电系数和厚度[J]. 光学学报, 2000, 20(5): 642～646

    Jiang Yi, Cao Zhuangqi, Shen Qishun et al.. Determination of the complex dielectric coefficient and thickness of absorbing films using guided waves[J]. Acta Optica Sinica, 2000, 20(5): 642～646

[14] 顾培夫,李海峰,章岳光 等. 用离子束溅射淀积的氧化物薄膜的折射率[J]. 光学学报, 2002, 22(3): 290～293

    Gu Peifu, Li Haifeng, Zhang Yueguang et al.. Refractive indexes of oxidized thin films deposited by ion beam sputtering[J]. Acta Optical Sinica, 2002, 22(3): 290～293

[15] 李毛和,张美敦. 用光纤迈克耳孙干涉仪测量折射率[J]. 光学学报, 2000, 20(9): 1294～1296

    Li Maohe, Zhang Meidun. Refractive index measured by optical fiber Michelson interferometer[J]. Acta Optica Sinica, 2000, 20(9): 1294～1296