强激光与粒子束, 2016, 28 (10): 103002, 网络出版: 2016-09-14
高电子迁移率晶体管放大器高功率微波损伤机理
ADDINNE.BibHigh Power microwave damage mechanism on high electron mobility transistor amplifier
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闫涛, 李平. 高电子迁移率晶体管放大器高功率微波损伤机理[J]. 强激光与粒子束, 2016, 28(10): 103002. Yan Tao, Li Ping. ADDINNE.BibHigh Power microwave damage mechanism on high electron mobility transistor amplifier[J]. High Power Laser and Particle Beams, 2016, 28(10): 103002.