残余应力对激光激发超声表面波技术检测二氧化硅体材料杨氏模量的影响 下载: 756次
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睢晓乐, 肖夏, 戚海洋, 孔涛. 残余应力对激光激发超声表面波技术检测二氧化硅体材料杨氏模量的影响[J]. 激光与光电子学进展, 2017, 54(12): 121202. Sui Xiaole, Xiao Xia, Qi Haiyang, Kong Tao. Influence of Residual Stress on Young Modulus Detection of SiO2 Bulk Materials by Laser-Induced Surface Ultrasonic Wave Technique[J]. Laser & Optoelectronics Progress, 2017, 54(12): 121202.