半导体光电, 2018, 39 (6): 815, 网络出版: 2019-01-10
磨料对硒化锌雾化施液化学机械抛光的影响
Effect of Abrasive on Ultrasound Fine Atomization CMP of Zinc Selenide
补充材料
李庆忠, 施卫彬, 夏明光. 磨料对硒化锌雾化施液化学机械抛光的影响[J]. 半导体光电, 2018, 39(6): 815. LI Qingzhong, SHI Weibin, XIA Mingguang. Effect of Abrasive on Ultrasound Fine Atomization CMP of Zinc Selenide[J]. Semiconductor Optoelectronics, 2018, 39(6): 815.