激光与光电子学进展, 2016, 53 (2): 023101, 网络出版: 2015-12-25
GexAsySe1-x-y硫系玻璃薄膜拉曼光谱分析 
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Structural Analysis of GexAsySe1-x-y Chalcogenide Glass Thin-Films by Raman Spectroscopy
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李宬汉, 王丽, 甘渝林, 苏雪琼. GexAsySe1-x-y硫系玻璃薄膜拉曼光谱分析[J]. 激光与光电子学进展, 2016, 53(2): 023101.
Li Chenghan, Wang Li, Gan Yulin, Su Xueqiong. Structural Analysis of GexAsySe1-x-y Chalcogenide Glass Thin-Films by Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2016, 53(2): 023101.
李宬汉, 王丽, 甘渝林, 苏雪琼. GexAsySe1-x-y硫系玻璃薄膜拉曼光谱分析[J]. 激光与光电子学进展, 2016, 53(2): 023101. Li Chenghan, Wang Li, Gan Yulin, Su Xueqiong. Structural Analysis of GexAsySe1-x-y Chalcogenide Glass Thin-Films by Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2016, 53(2): 023101.
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