利用透射光谱与X射线反射谱精确测量溶胶凝胶TiO2薄膜厚度和光学常数
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贾红宝, 孙菁华, 徐耀, 吴东, 吕海兵, 晏良宏, 袁晓东. 利用透射光谱与X射线反射谱精确测量溶胶凝胶TiO2薄膜厚度和光学常数[J]. 光学学报, 2012, 32(8): 0831001. Jia Hongbao, Sun Jinghua, Xu Yao, Wu Dong, Lü Haibing, Yan Lianghong, Yuan Xiaodong. Determination of Thickness and Optical Constants of Sol-Gel Derived TiO2 Films by Combined Analysis of Transmittance and X-Ray Reflectivity Spectra[J]. Acta Optica Sinica, 2012, 32(8): 0831001.